A Continuous-Time Waveform Monitoring Technique for On-Chip Power Noise Measurements in VLSI Circuits.
Yoji BandoSatoshi TakayaToru OhkawaToshiharu TakaramotoToshio YamadaMasaaki SoudaShigetaka KumashiroTohru MogamiMakoto NagataPublished in: IEICE Trans. Electron. (2011)
Keyphrases
- vlsi circuits
- power dissipation
- mixed signal
- low power
- power consumption
- measurement noise
- ultra low power
- multi channel
- measurement errors
- real time
- ibm power processor
- chip design
- low cost
- high speed
- monitoring system
- digital signal processing
- signal to noise ratio
- cmos technology
- measurement error
- markov chain
- finite state machines
- energy efficiency
- dynamical systems
- frequency domain
- high density
- markov processes
- digital circuits
- power management
- super resolution