Is IDDQ testing not applicable for deep submicron VLSI in year 2011?

Chih-Wen Lu Chauchin Su Chung-Len Lee Jwu E. Chen

Published in: Asian Test Symposium (2000)

Keyphrases

vlsi circuits
electron beam
low power
mixed signal
deep learning
correlation analysis
signal processing
test cases
power consumption
cross validation
database
model selection
high speed
pattern recognition
feature selection
computer vision
artificial intelligence