Junction-Level Thermal Analysis of 3-D Integrated Circuits Using High Definition Power Blurring.
Samson MelamedThorlindur ThorolfssonT. Robert HarrisShivam PriyadarshiPaul D. FranzonMichael B. SteerW. Rhett DavisPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2012)