Integrated circuit probe card troubleshooting based on rough set theory for advanced quality control and an empirical study.
Chen Fu ChienHsin-Jung WuPublished in: J. Intell. Manuf. (2024)
Keyphrases
- quality control
- rough set theory
- integrated circuit
- rough sets
- machine vision
- quality assurance
- attribute reduction
- decision table
- decision rules
- approximate reasoning
- rule generation
- granular computing
- fuzzy set theory
- manufacturing systems
- rough fuzzy
- knowledge discovery
- information entropy
- automated visual inspection
- expert systems
- rule extraction
- equivalence relation
- smart card
- knowledge reduction
- tool for data mining
- rule induction
- low cost
- discernibility matrix
- data reduction
- manufacturing process
- data analysis
- attribute set
- attribute reduction algorithm
- databases
- product quality
- variable precision rough set model
- concept lattice
- fuzzy sets
- information retrieval
- hardware description language
- neural network