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Fault Modeling and Pattern-Sensitivity Testing for a Multilevel DRAM.
Michael Redeker
Bruce F. Cockburn
Duncan G. Elliott
Yunan Xiang
Sue Ann Ung
Published in:
MTDT (2002)
Keyphrases
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fault diagnosis
multi dimensional
test cases
data mining
association rules
real time
artificial intelligence
image sequences
pattern matching
sensitivity analysis
high density