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Diagnostic Test of Robust Circuits.

Alejandro CookSybille HellebrandThomas IndlekoferHans-Joachim Wunderlich
Published in: Asian Test Symposium (2011)
Keyphrases
  • computationally efficient
  • genetic algorithm
  • expert systems
  • high speed
  • decision making
  • case study
  • test cases
  • partial occlusion
  • robust estimation
  • diagnostic tests