A Method to Derive Compact Test Sets for Path Delay Faults in Combinational Circuits.

Jayashree Saxena Dhiraj K. Pradhan

Published in: ITC (1993)

Keyphrases

test set
error rate
objective function
dynamic programming
high accuracy
detection method
cost function
probabilistic model
data sets
machine learning
significant improvement
test cases
segmentation method
data points
test data