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First Results in Patterning of Ultra High Aspect Ratio Microstructures by a 4T Wave Length Shifter at BESSY.
Martin Bednarzik
Heinz-Ulrich Scheunemann
Alexander Barth
Daniel Schondelmaier
Bernd Loechel
Published in:
ICMENS (2003)
Keyphrases
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ultra high
aspect ratio
data handling
high resolution
camera parameters
perspective projection
focal length
bounding box
ground truth
real time
principal point