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First Results in Patterning of Ultra High Aspect Ratio Microstructures by a 4T Wave Length Shifter at BESSY.

Martin BednarzikHeinz-Ulrich ScheunemannAlexander BarthDaniel SchondelmaierBernd Loechel
Published in: ICMENS (2003)
Keyphrases
  • ultra high
  • aspect ratio
  • data handling
  • high resolution
  • camera parameters
  • perspective projection
  • focal length
  • bounding box
  • ground truth
  • real time
  • principal point