Detection of apple defect using laser-induced light backscattering imaging and convolutional neural network.
Ang WuJuanhua ZhuTaiyong RenPublished in: Comput. Electr. Eng. (2020)
Keyphrases
- convolutional neural network
- face detection
- automatic detection
- object detection
- laser beam
- detection accuracy
- detection algorithm
- image processing
- detection method
- atomic force microscopy
- laser radar
- light intensity
- liquid crystal
- imaging systems
- false alarms
- anomaly detection
- event detection
- accurate localization
- high resolution
- neural network