RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems.
Maksim JenihhinSaid HamdiouiMatteo Sonza ReordaMilos KrsticPeter LangendörferChristian SauerAnton KlotzMichael HübnerJörg NolteHeinrich Theodor VierhausGeorgios N. SelimisDan AlexandrescuMottaqiallah TaouilGeert Jan SchrijenJaan RaikLuca SterponeGiovanni SquilleroZoya DykaPublished in: DATE (2020)
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