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Experimental study and numerical investigation on the formation of single event gate damages induced on medium voltage power MOSFET.

Giovanni BusattoGiuseppe CurròFrancesco IannuzzoAlberto PorzioAnnunziata SanseverinoFrancesco Velardi
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • experimental study
  • experimental evaluation
  • power system
  • single phase
  • energy dissipation
  • data sets
  • real life
  • low cost
  • power consumption
  • sensitivity analysis
  • synthetic datasets
  • transmission line