Defect-based test optimization for analog/RF circuits for near-zero DPPM applications.
Ender YilmazSule OzevPublished in: ICCD (2009)
Keyphrases
- analog vlsi
- analog circuits
- optimization problems
- digital circuits
- database
- high speed
- global optimization
- evolutionary algorithm
- signal processing
- learning algorithm
- floating gate
- radio frequency
- circuit design
- optimization process
- optimization methods
- optimization algorithm
- constrained optimization
- optimization method
- test data
- focal plane
- feature extraction
- case study
- built in self test