ESD characterization of planar InGaAs devices.

Z. Ji Dimitri Linten Roman Boschke Geert Hellings S. H. Chen AliReza Alian D. Zhou Y. Mols Tsvetan Ivanov Jacopo Franco Ben Kaczer X. Zhang R. Gao Jianfu Zhang Weidong Zhang Nadine Collaert Guido Groeseneken

Published in: IRPS (2015)

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