High-Density CMOS Multichip-Module Testing and Diagnosis.

Robert W. Bassett Pamela S. Gillis John J. Shushereba

Published in: ITC (1991)

Keyphrases

high density
low density
close proximity
high speed
model based diagnosis
data center
thin film
magnetic recording
power consumption
low cost
high power
fault diagnosis
power supply
fault detection
fault model
analog vlsi
circuit design
high bandwidth
computer simulation