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Fast Enhancement of Validation Test Sets to Improve Stuck-at Fault Coverage for RTL circuits.

Loganathan LingappanVijay GangaramNiraj K. Jha
Published in: VLSI Design (2007)
Keyphrases
  • test set
  • error rate
  • training set
  • image processing
  • training data
  • test data
  • test cases
  • image enhancement
  • neural network
  • decision trees
  • semi supervised
  • high speed
  • question answering
  • circuit design