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Analysis and modeling of a digital CMOS circuit operation and reliability after gate oxide breakdown: a case study.
Ben Kaczer
Robin Degraeve
Mahmoud Rasras
A. De Keersgieter
K. Van de Mieroop
Guido Groeseneken
Published in:
Microelectron. Reliab. (2002)
Keyphrases
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circuit design
high speed
data sets
data analysis
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statistical analysis
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real time
markov chain
digital circuits