Local Binary Pattern Symmetric Centre Feature Extraction Method for Detection of Image Forgery.
M. Pavan KalyanD. KishoreMahesh K. SinghPublished in: ICAIDS (2021)
Keyphrases
- local binary pattern
- multiscale
- spatial information
- input image
- image features
- image descriptors
- forgery detection
- image content
- copy move forgery
- image representation
- digital images
- binary patterns
- image analysis
- image collections
- illumination invariant
- textural features
- object detection
- single image
- image retrieval
- texture features
- standard deviation
- image segmentation
- three dimensional
- illumination compensation
- gray images
- rotation invariant
- feature descriptors
- texture classification
- partial occlusion
- similarity measure
- high resolution
- feature points
- texture descriptors
- feature extraction
- image structure
- detection algorithm
- post processing