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Accelerating concurrent fault simulation by parallel pattern emptiness checking of fault lists.

Yukio IshibashiMasahiro NagamatsuTorao Yanaru
Published in: Systems and Computers in Japan (1997)
Keyphrases
  • fault diagnosis
  • fault detection
  • pattern matching
  • parallel processing
  • fault model
  • artificial intelligence
  • multiple faults
  • expert systems
  • numerical simulations
  • massively parallel
  • nonlinear systems
  • normal operation