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In situ oxidation of ultrathin silver films on Ni(111).
Axel Meyer
Jan Ingo Flege
Sanjaya D. Senanayake
B. Kaemena
Robert E. Rettew
Faisal M. Alamgir
Jens Falta
Published in:
IBM J. Res. Dev. (2011)
Keyphrases
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electrical properties
gate dielectrics
metal oxide
film thickness
x ray
room temperature
low energy
thin film
solid state
grain size
real time
high speed
energy consumption
refractive index
field effect transistors
high resolution
preprocessing
image sequences
genetic algorithm