Design of a Fault Detection Circuit for One-Time Programmable Memories for Reducing Time.

Hye-Hyun Lee Kang-Yoon Lee

Published in: ICUFN (2023)

Keyphrases

fault detection
fault diagnosis
circuit design
failure detection
fault identification
neural network
low cost
industrial processes
association rules
decision support system
genetic programming
computer simulation
single chip
fault localization
electronic circuits
tennessee eastman