A Line-Based-Clustering Approach for Ball Grid Array Component Inspection in Surface-Mount Technology.
Huijun GaoWanxin JinXianqiang YangOkyay KaynakPublished in: IEEE Trans. Ind. Electron. (2017)
Keyphrases
- clustering algorithm
- clustering method
- closely spaced
- k means
- three dimensional
- grid points
- visual inspection
- self organizing maps
- key technologies
- rapid development
- hierarchical clustering
- cluster analysis
- cross section
- categorical data
- surface reconstruction
- cost effective
- outlier detection
- data processing
- data mining
- quality control
- line segments
- anomaly detection
- grid computing
- unsupervised learning
- printed circuit boards
- vision system
- d objects
- surface inspection
- grid cells