Test-architecture optimization for TSV-based 3D stacked ICs.
Brandon NoiaSandeep Kumar GoelKrishnendu ChakrabartyErik Jan MarinissenJouke VerbreePublished in: ETS (2010)
Keyphrases
- optimization problems
- optimization algorithm
- management system
- global optimization
- real time
- discrete optimization
- databases
- learning algorithm
- test data
- optimization methods
- optimization process
- optimization model
- layered architecture
- architectural design
- enterprise architecture
- distributed architecture
- network architecture
- constrained optimization
- optimization method
- software architecture
- statistically significant
- machine learning
- neural network