Machine Learning for Test, Diagnosis, Post-Silicon Validation and Yield Optimization.
Hussam AmrouchKrishnendu ChakrabartyDirk PflügerIlia PolianMatthias SauerMatteo Sonza ReordaPublished in: ETS (2022)
Keyphrases
- machine learning
- optimization algorithm
- diagnostic tests
- optimization method
- data mining
- high speed
- machine learning algorithms
- medical diagnosis
- optimization methods
- inductive learning
- global optimization
- machine learning methods
- learning algorithm
- optimization problems
- learning problems
- artificial intelligence
- optimization approaches
- model based diagnosis
- optimization process
- decision trees
- pattern recognition
- computer science
- low cost
- test data
- supervised learning
- knowledge acquisition
- natural language processing
- evolutionary algorithm
- data analysis
- test cases
- learning systems
- reinforcement learning
- information extraction
- constrained optimization
- semi supervised learning
- software testing