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BIST Design for Detecting Multiple Stuck-Open Faults in CMOS Circuits Using Transition Count.
Hafizur Rahaman
Debesh K. Das
Bhargab B. Bhattacharya
Published in:
J. Comput. Sci. Technol. (2002)
Keyphrases
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built in self test
circuit design
digital circuits
high speed
integrated circuit
case study
power dissipation
building blocks
design principles
engineering design
user interface
vlsi circuits
chip design
neural network
fault diagnosis
data sets
logic synthesis
high level synthesis