Test Flow Selection for Stacked Integrated Circuits.

Breeta SenGupta Dimitar Nikolov Assmitra Dash Erik Larsson

Published in: J. Electron. Test. (2019)

Keyphrases

integrated circuit
built in self test
computer vision
case study
video sequences
selection algorithm
statistical tests
selection criteria
electron beam
real time
artificial intelligence
test cases
flow field
printed circuit boards