A 3DIC interconnect interface test and repair scheme based on Hybrid IEEE1838 Die Wrapper Register and BIST circuit.

Changming Cui Junlin Huang

Published in: ETS (2021)

Keyphrases

high speed
feature selection
built in self test
user interface
test data
user friendly
machine learning
black box
power dissipation
computer society
neural network
test cases
damage assessment
wireless local area network