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Changming Cui
Publication Activity (10 Years)
Years Active: 2021-2023
Publications (10 Years): 2
Top Topics
Black Box
Computer Society
Test Cases
Power Dissipation
Top Venues
ETS
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Publications
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Changming Cui
,
Tuanhui Xu
,
Haitao Fu
,
Junlin Huang
Physical-aware Interconnect Testing and Repairing of Chiplets.
ETS
(2023)
Changming Cui
,
Junlin Huang
A 3DIC interconnect interface test and repair scheme based on Hybrid IEEE1838 Die Wrapper Register and BIST circuit.
ETS
(2021)