Login / Signup

Physical-aware Interconnect Testing and Repairing of Chiplets.

Changming CuiTuanhui XuHaitao FuJunlin Huang
Published in: ETS (2023)
Keyphrases
  • decision making
  • high speed
  • data sets
  • artificial intelligence
  • training data
  • test set
  • test cases
  • parallel algorithm