Assist and Architecture Requirements for SRAM using a 28nm Silicon Test Vehicle.
Kenza CharafeddineFaissal OuardiPublished in: BDIoT (2019)
Keyphrases
- cmos technology
- low power
- real time
- power consumption
- low cost
- management system
- leakage current
- high speed
- transmission electron microscopy
- application specific
- pedestrian detection
- heterogeneous environments
- data transmission
- embedded dram
- parallel processing
- low voltage
- nm technology
- silicon on insulator
- commercial off the shelf
- design goals
- power dissipation
- high density
- design methodology
- design principles
- test cases