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A Practical Approach to Threshold Test Generation for Error Tolerant Circuits.
Hideyuki Ichihara
Kenta Sutoh
Yuki Yoshikawa
Tomoo Inoue
Published in:
Asian Test Symposium (2009)
Keyphrases
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error tolerant
test generation
graph matching
test cases
static analysis
quality assurance
association patterns
subgraph isomorphism
data structure
matching algorithm
data sets
object oriented
software engineering
error rate
database
software testing
circuit design
databases