Integrated Test Data Decompression and Core Wrapper Design for Low-Cost System-on-a-Chip Testing.

Paul Theo Gonciari Bashir M. Al-Hashimi Nicola Nicolici

Published in: ITC (2002)

Keyphrases

test data
low cost
test cases
single chip
training data
test set
search based testing
low power consumption
testing process
training set
circuit design
high speed
black box
software testing
database
domain specific
decision trees
image processing
cross validation
feature selection
learning algorithm
real time