Circuit and Latch Capable of Masking Soft Errors with Schmitt Trigger.

Yoichi Sasaki Kazuteru Namba Hideo Ito

Published in: J. Electron. Test. (2008)

Keyphrases

circuit design
digital circuits
power consumption
artificial intelligence
error analysis
least squares
prediction error
evolutionary algorithm
low cost
high speed
human visual system
low power
high density
errors occur