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A New Microwave Axial Tomograph for the Inspection of Dielectric Materials.
Andrea Salvadè
Matteo Pastorino
Ricardo Monleone
Giovanni Bozza
Andrea Randazzo
Published in:
IEEE Trans. Instrum. Meas. (2009)
Keyphrases
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visual inspection
frequency band
defect detection
materials science
information retrieval
learning materials
automatic inspection
artificial intelligence
image processing
feature extraction
multiscale
quality control