Partial scan delay fault testing of asynchronous circuits.

Michael Kishinevsky Alex Kondratyev Luciano Lavagno Alexander Saldanha Alexander Taubin

Published in: ICCAD (1997)

Keyphrases

asynchronous circuits
delay insensitive
process algebra
fault diagnosis
fault detection
fault model
model checking
fault injection
database
software testing
scan data
real time embedded systems
test cases
sufficient conditions
web services
information systems
artificial intelligence