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QED: Quick Error Detection tests for effective post-silicon validation.

Ted HongYanjing LiSung-Boem ParkDiana MuiDavid LinZiyad Abdel KaleqNagib HakimHelia NaeimiDonald S. GardnerSubhasish Mitra
Published in: ITC (2010)
Keyphrases
  • error detection
  • error correction
  • error recovery
  • low cost
  • x ray
  • data cleansing
  • intelligent agents
  • high density