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Exploiting Thin-Film Properties and Guided-Mode Resonance for Designing Ultrahigh-Figure-of-Merit Refractive Index Sensors.
Duy Thanh Cu
Hong-Wei Wu
Hung-Pin Chen
Li-Chen Su
Chien-Cheng Kuo
Published in:
Sensors (2024)
Keyphrases
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thin film
figure of merit
refractive index
film thickness
edge detector
multi layer
high density
short circuit
neural network
feature extraction
surface normals
multi sensor
electrical properties