Login / Signup

Exploiting Thin-Film Properties and Guided-Mode Resonance for Designing Ultrahigh-Figure-of-Merit Refractive Index Sensors.

Duy Thanh CuHong-Wei WuHung-Pin ChenLi-Chen SuChien-Cheng Kuo
Published in: Sensors (2024)
Keyphrases
  • thin film
  • figure of merit
  • refractive index
  • film thickness
  • edge detector
  • multi layer
  • high density
  • short circuit
  • neural network
  • feature extraction
  • surface normals
  • multi sensor
  • electrical properties