FIGURE OF MERIT
Experts
- Chin-Hui Lee
- Kevin W. Bowyer
- Josef Kittler
- Sebastià Massanet
- Djemel Ziou
- Arnau Mir
- Wenlong Fu
- Mark Johnston
- Manuel González Hidalgo
- Sean Dougherty
- Mengjie Zhang
- Robert M. Haralick
- Ivan Kukanov
- Patricia Melin
- Wolfram H. H. J. Lunscher
- Didier Demigny
- Daniel Ruiz-Aguilera
- Mehdi Kiani
- Ville Hautamäki
- Christine Kranenburg
- Michael P. Beddoes
- Michel Chapron
- Peng-Lang Shui
- Muhittin Gökmen
- Sridha Sridharan
- S. Crand
- Richard Lippmann
- Baptiste Magnier
- Mohamed M. Bayoumi
- Sheng Gao
- Yun Bai
- Tat-Seng Chua
- Jacquelyn S. Fetrow
- Brendan Baker
- Huanzhao Zeng
- John See
- Caixia Zhou
- T. Hoang Ngan Le
- Ling-Hwei Chen
Venues
- CoRR
- ICASSP
- Sensors
- IEEE Trans. Pattern Anal. Mach. Intell.
- ISCAS
- ICIP
- Pattern Recognit.
- CVPR
- IEEE Access
- EUSIPCO
- EMBC
- Pattern Recognit. Lett.
- Signal Process.
- Comput. Vis. Image Underst.
- ICPR (3)
- Color Imaging Conference
- IECON
- Entropy
- IEEE J. Solid State Circuits
- IEEE Trans. Speech Audio Process.
- ICIAP
- Multim. Tools Appl.
- PICS
- ACIVS
- IEEE Trans. Signal Process.
- VLSI Design
- ICECS
- Image Vis. Comput.
- IEEE Trans. Syst. Man Cybern.
- ICIP (2)
- ISCAS (4)
- J. Multiple Valued Log. Soft Comput.
- J. Electronic Imaging
- IEEE Trans. Geosci. Remote. Sens.
- IQSP
- IEEE Trans. Fuzzy Syst.
- SIU
- IEICE Electron. Express
- Wirel. Pers. Commun.
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