FIGURE OF MERIT
Experts
- Chin-Hui Lee
- Kevin W. Bowyer
- Arnau Mir
- Sebastià Massanet
- Djemel Ziou
- Josef Kittler
- Manuel González Hidalgo
- Mengjie Zhang
- Sean Dougherty
- Wenlong Fu
- Mark Johnston
- Michel Chapron
- Didier Demigny
- Christine Kranenburg
- Peng-Lang Shui
- Robert M. Haralick
- Patricia Melin
- Wolfram H. H. J. Lunscher
- Ivan Kukanov
- Ville Hautamäki
- Muhittin Gökmen
- Michael P. Beddoes
- Mehdi Kiani
- Daniel Ruiz-Aguilera
- Mohamed M. Bayoumi
- Sridha Sridharan
- Anca Andreica
- Haibin Ling
- Min C. Shin
- Kazunori Kotani
- Suejit Pechprasarn
- Roy Wallace
- Saeed Bagheri Shouraki
- Qian Xiao
- Mubarak Shah
- Chin-Chen Chang
- Bhabatosh Chanda
- T. Hoang Ngan Le
- Carlos Lopez-Molina
Venues
- CoRR
- ICASSP
- Sensors
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICIP
- ISCAS
- Pattern Recognit.
- CVPR
- EUSIPCO
- IEEE Access
- Pattern Recognit. Lett.
- EMBC
- Signal Process.
- IECON
- Comput. Vis. Image Underst.
- Entropy
- ICPR (3)
- Color Imaging Conference
- ACIVS
- IEEE J. Solid State Circuits
- IEEE Trans. Syst. Man Cybern.
- PICS
- IEEE Trans. Signal Process.
- Image Vis. Comput.
- ICIAP
- ICIP (2)
- ISCAS (4)
- ICECS
- VLSI Design
- Multim. Tools Appl.
- IEEE Trans. Speech Audio Process.
- VCIP
- Digital Photography
- IEEE Trans. Image Process.
- CinC
- OFC
- IJCNN
- IEEE Trans. Circuits Syst. II Express Briefs
- J. Electronic Imaging
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