FIGURE OF MERIT
Experts
- Chin-Hui Lee
- Kevin W. Bowyer
- Arnau Mir
- Djemel Ziou
- Sebastià Massanet
- Josef Kittler
- Sean Dougherty
- Mengjie Zhang
- Wenlong Fu
- Mark Johnston
- Manuel González Hidalgo
- Mehdi Kiani
- Ville Hautamäki
- Michael P. Beddoes
- Christine Kranenburg
- Michel Chapron
- Peng-Lang Shui
- Muhittin Gökmen
- Robert M. Haralick
- Ivan Kukanov
- Patricia Melin
- Didier Demigny
- Wolfram H. H. J. Lunscher
- Daniel Ruiz-Aguilera
- Maria Petrou
- Zongmin Li
- Olivia Mendoza
- K. Paler
- Ali Moghiseh
- Rebecca Silveston-Keith
- Kehuang Li
- Tiago de Freitas Pereira
- Eugène C. Ezin
- Mengyang Pu
- Jeffrey A. Mudrock
- Sabato Marco Siniscalchi
- Vittorio Curri
- Michael J. Vrhel
- Mubarak Shah
Venues
- CoRR
- ICASSP
- Sensors
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICIP
- ISCAS
- Pattern Recognit.
- CVPR
- Pattern Recognit. Lett.
- Signal Process.
- EMBC
- IEEE Access
- EUSIPCO
- Entropy
- IECON
- Comput. Vis. Image Underst.
- ICPR (3)
- Color Imaging Conference
- ICIP (2)
- ISCAS (4)
- ICECS
- Image Vis. Comput.
- IEEE Trans. Syst. Man Cybern.
- IEEE Trans. Signal Process.
- VLSI Design
- IEEE Trans. Speech Audio Process.
- IEEE J. Solid State Circuits
- ICIAP
- Multim. Tools Appl.
- PICS
- ACIVS
- IGARSS
- DATE
- NIPS
- CVGIP Graph. Model. Image Process.
- Comput. Stat. Data Anal.
- Comput. Vis. Graph. Image Process.
- IEEE Trans. Circuits Syst. II Express Briefs
- CinC
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