FIGURE OF MERIT
Experts
- Chin-Hui Lee
- Kevin W. Bowyer
- Djemel Ziou
- Sebastià Massanet
- Josef Kittler
- Arnau Mir
- Manuel González Hidalgo
- Mengjie Zhang
- Wenlong Fu
- Sean Dougherty
- Mark Johnston
- Wolfram H. H. J. Lunscher
- Patricia Melin
- Christine Kranenburg
- Mehdi Kiani
- Michel Chapron
- Robert M. Haralick
- Michael P. Beddoes
- Ville Hautamäki
- Didier Demigny
- Daniel Ruiz-Aguilera
- Ivan Kukanov
- Peng-Lang Shui
- Muhittin Gökmen
- Chin-Chen Chang
- Michael J. Vrhel
- Yachuan Li
- Madasu Hanmandlu
- Tiago de Freitas Pereira
- Humberto Bustince Sola
- Yuriy S. Shmaliy
- Brendan Baker
- Richard Lippmann
- Shantaram Vasikarla
- Cina Motamed
- Claudia Redenbach
- Makoto Matsumoto
- Mubarak Shah
- Jacquelyn S. Fetrow
Venues
- CoRR
- ICASSP
- Sensors
- IEEE Trans. Pattern Anal. Mach. Intell.
- ISCAS
- ICIP
- Pattern Recognit.
- CVPR
- Pattern Recognit. Lett.
- EUSIPCO
- Signal Process.
- IEEE Access
- EMBC
- ICPR (3)
- Color Imaging Conference
- Comput. Vis. Image Underst.
- IECON
- Entropy
- ICIP (2)
- VLSI Design
- IEEE J. Solid State Circuits
- ICIAP
- Image Vis. Comput.
- ACIVS
- Multim. Tools Appl.
- IEEE Trans. Syst. Man Cybern.
- IEEE Trans. Speech Audio Process.
- PICS
- ICECS
- ISCAS (4)
- IEEE Trans. Signal Process.
- OFC
- J. Electronic Imaging
- ICRA
- CVGIP Graph. Model. Image Process.
- J. Multiple Valued Log. Soft Comput.
- ASP-DAC
- SIU
- Wirel. Pers. Commun.
Related Topics
Related Keywords
Popularity