FIGURE OF MERIT
Experts
- Chin-Hui Lee
- Kevin W. Bowyer
- Sebastià Massanet
- Josef Kittler
- Arnau Mir
- Djemel Ziou
- Mark Johnston
- Manuel González Hidalgo
- Sean Dougherty
- Wenlong Fu
- Mengjie Zhang
- Mehdi Kiani
- Michael P. Beddoes
- Muhittin Gökmen
- Daniel Ruiz-Aguilera
- Michel Chapron
- Didier Demigny
- Ivan Kukanov
- Peng-Lang Shui
- Robert M. Haralick
- Patricia Melin
- Christine Kranenburg
- Wolfram H. H. J. Lunscher
- Ville Hautamäki
- S. Crand
- K. Paler
- Sabato Marco Siniscalchi
- Rebecca Silveston-Keith
- Mikaël A. Mousse
- Bashir Olaniyi Sadiq
- Abder Koukam
- Tat-Seng Chua
- Makoto Shohara
- Kehuang Li
- Qian Xiao
- Yaping Huang
- Amy L. Olex
- Vittorio Curri
- Sridha Sridharan
Venues
- CoRR
- ICASSP
- Sensors
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICIP
- ISCAS
- Pattern Recognit.
- CVPR
- Signal Process.
- IEEE Access
- EMBC
- EUSIPCO
- Pattern Recognit. Lett.
- Entropy
- Comput. Vis. Image Underst.
- IECON
- Color Imaging Conference
- ICPR (3)
- PICS
- IEEE Trans. Speech Audio Process.
- IEEE Trans. Syst. Man Cybern.
- ISCAS (4)
- ACIVS
- VLSI Design
- IEEE J. Solid State Circuits
- ICECS
- Multim. Tools Appl.
- ICIP (2)
- Image Vis. Comput.
- ICIAP
- IEEE Trans. Signal Process.
- CinC
- Graphs Comb.
- CVGIP Graph. Model. Image Process.
- IEEE Trans. Instrum. Meas.
- IJCNN
- INTERSPEECH
- IQSP
- ICNN
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