Combining multiple DFT schemes with test generation.
Ben MathewDaniel G. SaabPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1999)
Keyphrases
- combining multiple
- test generation
- test cases
- symbolic execution
- test sequences
- design automation
- static analysis
- quality assurance
- cluster ensemble
- fusion methods
- frequency domain
- fourier transform
- discrete fourier transform
- test data generation
- software testing
- artificial intelligence
- life cycle
- vision system
- clustering ensemble
- database systems
- case study