Critical Fields in Ferromagnetic Thin Films: Identification of Four Regimes.

Rubén Cantero-Álvarez Felix Otto

Published in: J. Nonlinear Sci. (2006)

Keyphrases

thin film
electron microscopy
grain size
room temperature
multi layer
high density
short circuit
magnetic field
white light interferometry
chemical vapor deposition
artificial neural networks
image data
solar cell