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Image Registration in Electron Microscopy. A Stochastic Optimization Approach.
Juana López Redondo
Pilar Martínez Ortigosa
Inmaculada García
José-Jesús Fernández
Published in:
ICIAR (2) (2004)
Keyphrases
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stochastic optimization
electron microscopy
image registration
x ray
low energy
image stacks
multistage
mutual information
thin film
coarse to fine
image processing
image analysis
computer vision
high density
transmission electron microscopy