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Efficient Path Delay Fault Test Generation Algorithms for Weighted Random Robust Testing.
Y.-M. Hur
J.-H. Shin
K.-H. Lee
Y.-S. Son
I.-C. Lim
Y.-H. Kim
Published in:
Asian Test Symposium (1996)
Keyphrases
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test generation
computationally efficient
highly efficient
test cases
design automation
learning algorithm
fault detection
software testing
database
database systems
shortest path
reverse engineering
quality assurance