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基于卷积去噪自编码器的芯片表面弱缺陷检测方法 (Detection Method of Chip Surface Weak Defect Based on Convolution Denoising Auto-encoders).
Yuetong Luo
Jingshuai Bian
Meng Zhang
Yongming Rao
Feng Yan
Published in:
计算机科学 (2020)
Keyphrases
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detection method
denoising
image processing
image denoising
face detection
detection algorithm
noisy images
high speed
total variation
natural images
feature detection
three dimensional
low cost
surface defects
denoising methods
noise removal
d objects
computer vision
multiscale
gaussian noise
denoising algorithm