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Evaluation of the impact of the physical dimensions and material of the semiconductor chip on the reliability of Sn3.5Ag solder interconnect in power electronic module: A finite element analysis perspective.

Pushparajah RajaguruHua LuChris BaileyJose Angel Ortiz GonzalezOlayiwola Alatise
Published in: Microelectron. Reliab. (2017)
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