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Functional fault models for non-scan sequential circuits.

Eduardas BareisaVacius JusasKestutis MotiejunasRimantas Seinauskas
Published in: Microelectron. Reliab. (2011)
Keyphrases
  • fault models
  • model based diagnosis
  • fault management
  • horn clauses
  • fault model
  • network management
  • first order logic
  • model checking
  • conflict resolution