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Raman approach in silicon nanostructure at 1.5 micron.

Luigi SirletoMaria Antonietta FerraraBahram JalaliIvo Rendina
Published in: Nano-Net (2007)
Keyphrases
  • cmos technology
  • multi component
  • electron beam
  • high density
  • semiconductor devices
  • raman spectra
  • low cost
  • high speed
  • gallium arsenide
  • power consumption
  • low power
  • silicon dioxide
  • decision making
  • space charge