Detecting Defects With Support Vector Machine in Logistics Packaging Boxes for Edge Computing.
Xi YangMingrui HanHengliang TangQian LiXiong LuoPublished in: IEEE Access (2020)
Keyphrases
- support vector machine
- multi class
- edge detection
- multiscale
- defect detection
- automatic detection
- high speed
- multi class support vector machines
- k nearest neighbor
- knn
- support vector
- feature selection
- feature vectors
- training data
- face recognition
- image processing
- decision making
- svm classifier
- classification method
- edge information
- supply chain management
- high density
- multiple scales
- small sample
- machine learning
- data mining