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On Covering Structural Defects in NoCs by Functional Tests.
Atefe Dalirsani
Nadereh Hatami
Michael E. Imhof
Marcus Eggenberger
Gert Schley
Martin Radetzki
Hans-Joachim Wunderlich
Published in:
ATS (2014)
Keyphrases
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structural information
defect classification
defect detection
image processing
data structure
artificial neural networks
functional properties
machine learning
information retrieval
genetic algorithm
computer vision
three dimensional
learning environment
statistical tests
structural constraints