A parallel branch and bound algorithm for test generation.
Srinivas PatilPrithviraj BanerjeePublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1990)
Keyphrases
- branch and bound algorithm
- test generation
- lower bound
- branch and bound
- upper bound
- test cases
- optimal solution
- precedence constraints
- symbolic execution
- lower bounding
- combinatorial optimization
- np hard
- randomly generated problems
- lagrangian relaxation
- upper bounding
- design automation
- single machine scheduling problem
- branch and bound method
- finding an optimal solution
- software testing
- mixed integer linear programming
- quality assurance
- static analysis
- shared memory
- variable ordering
- code coverage
- parallel computing
- object oriented