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A New Framework for Designing: Built-in Test Multichip Modules with Pipelined Test Strategy.

Ting-Ting Y. LinHuoy-Yu Liou
Published in: IEEE Des. Test Comput. (1993)
Keyphrases
  • test data
  • real time
  • probabilistic model
  • main contribution
  • test cases
  • database
  • real world
  • genetic algorithm
  • artificial intelligence
  • theoretical framework
  • statistical tests