Fault isolation by test scheduling for embedded systems using a probabilistic approach.

Daoud Aït-Kadi Zineb Simeu-Abazi Ahmed Arous

Published in: J. Intell. Manuf. (2018)

Keyphrases

embedded systems
fault isolation
diagnostic tests
low cost
computing power
embedded devices
embedded software
real time systems
flash memory
physical systems
error detection
hw sw
software systems
test cases
fault diagnosis